https://w3id.org/geochem/1.0/analyticalmethod/atomicforcemicroscopy
| label | Atomic force microscopy | |||||
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| notation | AFM | |||||
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| definition | a high-resolution, non-optical imaging technique that uses a cantilever with a sharp tip to scan over a sample surface. AFM can be used to image almost any type of surface, including polymers, ceramics, composites, glass, and biological samples. AFM can also be used to measure and localize many different forces, including adhesion strength, magnetic forces, and mechanical properties. | |||||
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| in scheme | Analytical methods for geochemistry and cosmochemistry original | |||||